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Mapping quantitative trait loci associated with spot blotch and net blotch resistance in a doubled-haploid barley population

机译:在双单倍体大麦群体中定位与斑点斑点和净斑点抗性相关的数量性状基因座

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Spot blotch and net blotch are important foliar barley (Hordeum vulgare L.) diseases in Canada and elsewhere. These diseases result in significant yield reduction and, more importantly, loss of grain quality, downgrading barley from malt to feed. Combining resistance to these diseases is a breeding priority but is a significant challenge using conventional breeding methodology. In the present investigation, an evaluation of the inheritance of resistance to spot and net blotch was conducted in a doubled-haploid barley population from the cross CDC Bold (susceptible) x TR251 (resistant). The population was screened at the seedling stage in the Phytotron and at the adult-plant stage in the field for several years. Chi-squared analysis indicated one- to four-gene segregation depending on disease, isolate, plant development stage, location and year. A major seedling and adult-plant resistance quantitative trait locus (QTL), designated QRpt6, was re-confirmed for net-form net blotch resistance, explaining 32-61% of phenotypic variation in different experiments. Additional QTL for seedling and adult-plant resistance to net blotch were identified. For spot blotch resistance, a major seedling resistance QTL (QRcss1) was detected on chromosome 1H for isolate WRS1909, explaining 79% of the phenotypic variation. A highly significant QTL on 3H (QRcs3) was identified for seedling resistance to isolate WRS1908 and adult-plant resistance at Brandon, MB, Canada in 2008. The identification of QTL at only one location or from 1 year suggests spot blotch resistance is complex and highly influenced by the environment. Efforts are being made to combine spot and net blotch resistance in elite barley lines using molecular marker-assisted selection.
机译:在加拿大和其他地方,斑点斑点和净斑点是重要的大麦叶面病(Hordeum vulgare L.)。这些疾病导致大幅度减产,更重要的是导致谷物品质下降,将大麦从麦芽降低为饲料。结合对这些疾病的抗性是育种的重点,但使用常规育种方法是一项重大挑战。在本研究中,对来自交叉CDC Bold(易感)x TR251(抗性)的双单倍体大麦种群进行了对斑点和净斑点抗性遗传的评估。在光田育苗期和田间成年期对种群进行了筛选。卡方分析表明取决于疾病,分离株,植物发育阶段,位置和年份的一到四个基因分离。重新确认了一个主要的幼苗和成年植物抗性定量性状基因座(QTL),命名为QRpt6,具有净形式的净斑点抗性,解释了不同实验中表型变异的32-61%。确定了用于幼苗和成年植物对净斑点的抗性的其他QTL。对于斑点斑点抗性,分离株WRS1909在染色体1H上检测到主要的幼苗抗性QTL(QRcss1),解释了79%的表型变异。在2008年加拿大加拿大布兰登市,针对分离WRS1908的幼苗抗性和成年植物抗性鉴定了3H(QRcs3)高度重要的QTL。仅在一个位置或从1年起鉴定QTL表明斑点抗性很复杂,并且受环境影响很大。人们正在努力通过分子标记辅助选择,将大麦品系中的斑点和净斑抗性结合起来。

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