Mapping of quantitative trait loci (QTLs) for Stagonospora glume blotch resistance in wheat

摘要

Glume blotch of wheat caused by Stagonospora nodorum occurs in many wheat-growing regions worldwide and is considered to be among the major diseases of wheat in humid temperate climates, resulting in significant losses in grain quality and yield. Incorporation of resistance to glume blotch into wheat using conventional methods is difficult because resistance appears to be inherited as a quantitative character. The use of quantitative resistance in breeding programs would be greatly facilitated by marker-assisted selection. Therefore, the aim of this study was to identify and localize the genes involved in the resistance to glume blotch of wheat. A population of 164 Fi-derived doubled haploid (DH) lines from the cross 'Frontana' (resistant)/ 'Remus'(susceptible) was evaluated for glume blotch resistance at the adult stage in the greenhouse. Three QTLs were detected, and together they explained 36.4% of the phenotypic variance. Two QTLs were mapped to chromosome 5A and 'Frontana' contributed the alleles for resistance, and the third QTL to chromosome 3B and the resistant allele was derived from 'Remus'. The ultimate goal of the QTL analysis is to develop tools that are useful for marker assisted selection for glume blotch resistance in practical breeding programs.