首页> 外文期刊>Molecular crystals and liquid crystals >Field emission characteristics of an oxidized porous polysilicon using thermal oxidation and electrochemical oxidation
【24h】

Field emission characteristics of an oxidized porous polysilicon using thermal oxidation and electrochemical oxidation

机译:使用热氧化和电化学氧化的氧化多孔多晶硅的场发射特性

获取原文
获取原文并翻译 | 示例
       

摘要

The field emission characteristics of an oxidized porous polysilicon were investigated using different oxidation process with Pt/Ti multi layer electrode. The surface oxidation layer on an oxidized porous polysilicon was formed by thermal oxidation and electrochemical oxidation. The emission efficiency of thermal oxidation which was performed in a dry O-2 with O-2 flow rate of 3/min at 900 degrees C for 60 min showed 3.36% at V-ps = 16 V. The electrochemical oxidation was formed by solution containing 1 M sulphuric acid under 10 mA/cm(2) for 40 sec and was annealed 5 hr to improve oxide quality at 600 degrees C. The emission efficiency of electrochemical oxidation showed 3.81% at V-ps = 14 V.
机译:利用Pt / Ti多层电极,采用不同的氧化工艺研究了氧化多孔多晶硅的场发射特性。通过热氧化和电化学氧化在氧化的多孔多晶硅上形成表面氧化层。在O-2流量为3 / min的干燥O-2中在900摄氏度下进行60分钟的热氧化的发射效率在V-ps = 16 V时显示为3.36%。通过溶液形成电化学氧化在10 mA / cm(2)下含有1 M的硫酸40秒钟,然后退火5个小时以提高600摄氏度的氧化物质量。电化学氧化的发射效率在V-ps = 14 V时显示为3.81%。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号