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首页> 外文期刊>Molecular crystals and liquid crystals >Study on n-type Doped Electron-Transporting Layers in OLEDs by Electron Spin Resonance
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Study on n-type Doped Electron-Transporting Layers in OLEDs by Electron Spin Resonance

机译:利用电子自旋共振研究OLED中的n型掺杂电子传输层

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摘要

We present an electron spin resonance (ESR) study of Cs2CO3 and LiF doped tris(8-hydroxyquinoline) aluminum (Alq(3)) thin films. The g values of the Cs2CO3 and LiF doped Alq(3) thin films were obtained as 2.0040 and 2.0028, repectively. The g value of the LiF doped film was very close to a theoretically calculated one for an isolated Alq(3) radical anion, while Cs2CO3 doped film showed a large g shift. This feature can be explained by large spin-orbit interaction caused by heavy Cs atoms. While doping of Cs2CO3 did not showed cathode-metal (Al and Au) dependence, LiF doping required Al as cathode.
机译:我们目前对Cs2CO3和LiF掺杂的三(8-羟基喹啉)铝(Alq(3))薄膜的电子自旋共振(ESR)研究。 Cs2CO3和LiF掺杂的Alq(3)薄膜的g值分别为2.0040和2.0028。掺杂LiF的薄膜的g值非常接近理论计算值(对于孤立的Alq(3)自由基阴离子),而掺杂Cs2CO3的薄膜显示出较大的g偏移。可以通过重Cs原子引起的大自旋轨道相互作用来解释此特征。尽管Cs2CO3的掺杂没有显示出阴极金属(Al和Au)的依赖性,但LiF掺杂需要Al作为阴极。

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