Evaluation of Surface Roughness of Metal Thin Films and Langmuir-Blodgett Ultrathin Films from Scattered Light Due to Surface Plasmon Polariton

摘要

Scattered light properties from Ag thin films andarachidic acid (C20) Langmuir-Blodgett (LB) films on the Agthin thin films were investigated to evaluate the surfaceroughnesses ofthese films utilizing the surface plasmon polariton(SPP) excited in the attenuated total reflection (ATR)configuration. The surface roughness of the films was estimatedfrom the angular distribution of the scattered lights. This resultswas qualitatively corresponding to the evaluation by the atomicforce microscope (AFM) measurements.