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Practical aspects of phase correction determination for gauge blocks measured by optical interferometry

机译:通过光学干涉测量仪测量量块的相位校正确定的实际情况

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摘要

Determination of a phase correction is necessary when making interferometric measurements of gauge blocks with an auxiliary platen. The phase correction compensates for the differences in the reflecting properties of the gauge block and the platen surfaces. Different phase corrections are reported for gauge blocks of different manufacturers, made from different materials and with different surface roughness compared to the platen. In this paper, the process of selection of the best surface roughness parameter and the influence of different complex refractive indices of the same type of material are analysed. The new surface roughness parameter based on the difference between the weighted mean of maximum and minimum asperities of 3D surface roughness measured by a modernized Linnik phase shifting interferometer is introduced. The results of comparison of the phase correction values calculated from the difference between the weighted mean values and calculated from stack method measurements are presented and discussed. The complementary method of phase correction measurement based on the cross-wringing method with the use of the modernized phase shifting Kosters interferometer is proposed.
机译:用辅助压板对量块进行干涉测量时,必须确定相位校正。相位校正可以补偿量规块和压板表面反射特性的差异。据报道,与压板相比,不同制造商的量规块具有不同的相位校正,该量规块由不同的材料制成且具有不同的表面粗糙度。本文分析了最佳表面粗糙度参数的选择过程以及同一材料不同复折射率的影响。介绍了一种新的表面粗糙度参数,该参数基于现代化的Linnik相移干涉仪测得的3D表面粗糙度的最大和最小粗糙度的加权平均值之间的差。提出并讨论了根据加权平均值之间的差异计算得出的相位校正值的比较结果,以及根据叠加方法测量得出的结果。提出了一种基于交叉扭曲法的相位校正测量的补充方法,该方法采用了现代化的相移Kosters干涉仪。

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