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Determination of the phase-change correction used for gauge block calibration by optical interferometry technique

机译:光学干涉测量技术测定用于规格块校准的相变校正

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Phase-change corrections used for gauge block calibration for gauge block and base plate of various materials were investigated. Experimentally determined phase-change corrections obtained from three different gauge block interferometer (GBI) were compared. Experimental result illustrate that phase-change correction is characteristic of the interferometer system. The values are appeared to be inconsistent difference for all materials. Gauge block calibration after applying phase-change correction for all gauge block interferometer system was compared and En ratio are well below 1.
机译:研究了用于规格块校准的计量块和各种材料的底板的相变校正。比较了从三种不同规格块干涉仪(GBI)获得的实验确定的相变校正。实验结果说明了相变校正是干涉仪系统的特征。似乎对所有材料似乎不一致。测量块校准在对所有规格块干涉仪系统应用相变校正后,比较,en比率远低于1。

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