Jitter measurement circuit for mixed signal production test

摘要

This paper presents a novel low-cost jitter measurement circuit for production test. The hardware implementation is based on the so-called analytic signal method. The circuit consists of two parts: high-speed ADC sampling and DSP computation. The uniqueness of this circuit comes from the fact that the FPGA is used as both the ADC sampling controller and the main computation engine, which can significantly reduce the test cost. To validate the design effectiveness, measurements results have been compared between various instruments and this proposed circuit.