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Surface oxidation of rhodonite: structural and chemical study by surface scattering and glancing incidence XAS techniques

机译:罗丹石的表面氧化:通过表面散射和掠射入射XAS技术进行结构和化学研究

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Oxidative dissolution of a primary Mn-silicate phase (rhodonite) was studied via synchrotron X-ray techniques. The study was designed to combine the element-specific chemical technique of Glancing Incidence X-ray Absorption Spectroscopy (GIXAS) with the surface structural technique of X-ray scattering in order to produce the first depth resolved study of Mn-silicate low-temperature reactivity. A chemo-mechanically polished polycrystalline rhodonite sample was characterized and then reacted with pH 3.5 nitric acid. The surface originally had a mosaic structure and 15.5 (+-1) A r.m.s. roughness. Surface composition was not measurably different from bulk rhodonite before reaction, indicating that the surface preparation regimen had not produced an altered surface. After I h of reaction the roughness of the mineral surface decreased and reflectivity oscillations developed, resulting from the formation of a leached layer. This layer was 74.7 (+-2) A thick with an electron density equal to 72 percent of that of bulk rhodonite (equal to the loss of approx 1 in 2 Mn atoms). Both the primary and the buried interfaces had similar roughnesses; 4.9 and 4.5 (+-1.0) A, respectively. Diffuse scatter indicated that the correlation length between surface features also decreased. The GIXAS analysis showed that the Mn remaining in the surface had become oxidized, with the degree of oxidation decreasing as a function of depth. Oxidation penetrated at least 140 A into the structure. A further 2.5 h of reaction at pH 3.5 caused dissolution of the leached layer and reduced the thickness of this altered region to 16.0 (+-2) A, while surface roughness increased slightly to 6.2 (+-1.0) A. Depletion of Mn in this region increased only slightly relative to the first reaction step; the electron density was 67 percent that of bulk rhodonite, equivalent to the loss of 2 in 3 Mn atoms. The thickness of the oxidized region however, persisted. Analysis by XPS on the same specimen corroborates the X-ray results.
机译:通过同步加速器X射线技术研究了锰锰硅酸盐相(辉锰矿)的氧化溶解。该研究旨在将掠入射X射线吸收光谱(GIXAS)的元素特定化学技术与X射线散射的表面结构技术相结合,以进行锰硅酸盐低温反应性的首次深度解析研究。对化学机械抛光的多晶菱锰矿样品进行了表征,然后与pH 3.5硝酸反应。该表面最初具有镶嵌结构,并且具有15.5(+ -1)a.m.s.的r.m.s。粗糙度。表面组成与反应前的块状罗丹石没有明显不同,表明表面制备方案未产生改变的表面。反应1小时后,矿物表面的粗糙度降低,并且由于形成了浸出层而导致反射率振荡发展。该层的厚度为74.7(+ -2)厚,电子密度等于总菱锰矿的电子密度的72%(等于2 Mn原子损失约1)。主界面和掩埋界面的粗糙度相似。分别为4.9和4.5(+ -1.0)A。漫散射表明表面特征之间的相关长度也减小了。 GIXAS分析表明,残留在表面的Mn已被氧化,氧化程度随深度而降低。氧化作用至少渗透了140A。在pH 3.5的条件下再进行2.5小时的反应会导致沥滤层溶解,并将该变化区域的厚度减小至16.0(+ -2)A,而表面粗糙度略微增加至6.2(+ -1.0)A。相对于第一反应步骤,该区域仅稍微增加;电子密度为总菱锰矿的67%,相当于3个Mn原子损失2个。但是,氧化区域的厚度仍然存在。用XPS对同一标本进行分析可证实X射线结果。

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