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机译:
Division of Engineering and Applied Sciences, Harvard University, Cambridge, Massachusetts 02138;
机译:A modified Hall-Petch relation for predicting size-induced weakening effect on yield strength of coarse-grained thin films and wires
机译:Size effects on yield strength and strain hardening for ultra-thin Cu films with and without passivation: A study by synchrotron and bulge test techniques
机译:The yield strengths of polycrystalline thin films
机译:LOW-TEMPERATURE EMISSIVITY OF THIN AL2O3 LAYERS DEPOSITED ON COPPER SUBSTRATE
机译:Characterization of the Solute Transport Properties of the Active Layers of Polyamide Thin Film Composite Membranes =聚酰胺薄膜复合膜活性层溶质输运性质的表征
机译:体内铜掺入铜绿蛋白:COPPER64和COPPER67的研究
机译:Effects of Hydrogen plasma on the Electrical properties of F-Doped ZnO Thin Films and p-i-n -si:H Thin Film solar Cells
机译:studies of ferroelectric heterostructure thin films and interfaces via in situ211 analytical techniques