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TUNABLE (BA, SR)TIO{sub}3 INTERDIGITAL CAPACITOR ONTO SI WAFER FOR RECONFIGURABLE RADIO

机译:用于可重构无线电的SI晶片上的可调式(BA,SR)TIO {sub} 3数字电容器

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摘要

In this article, the potential feasibility of integrating BST films into Si wafer by adopting tunable interdigital capacitor (IDC) with TiO{sub}2 thin film buffer layer is suggested. TiO{sub}2 as buffer layer is grown onto Si substrate by atomic layer deposition and the coplanar IDC on Ba{sub}xSr{sub}(1-x)TiO{sub}3(500 nm)/TiO{sub}2(50 nm)/high resistivity Si (HR-Si) is fabricated. BST interdigital tunable capacitors integrated on HR-Si substrate with high tunability and low loss tangent are characterized for their microwave performances. BST/HR-Si and BST/TiO{sub}2/HR-Si IDCs show much enhanced tunability values of 31% and 40%, respectively as compared to the value of 21% obtained with BST film on MgO single crystal substrate at the bias of 5 kV/cm. BST/TiO{sub}2/HR-Si structure shows much improved figure of merit of 504.4 as compared to 418.53 and 101.68 of BST/MgO and BST/HR-Si structure, respectively.
机译:本文提出了采用带TiO {sub} 2薄膜缓冲层的可调叉指电容器(IDC)将BST膜集成到Si晶片中的潜在可行性。通过原子层沉积和在Ba {sub} xSr {sub}(1-x)TiO {sub} 3(500 nm)/ TiO {sub} 2上的共面IDC将TiO {sub} 2作为缓冲层生长到Si衬底上(50nm)/高电阻率的Si(HR-Si)被制造。集成在HR-Si基板上,具有高可调性和低损耗正切的BST叉指可调电容器具有微波性能。 BST / HR-Si和BST / TiO {sub} 2 / HR-Si IDC的可调谐性值分别提高了31%和40%,而在MgO单晶衬底上的BST膜的可调谐性值则为21%。偏压为5 kV / cm。与分别为BST / MgO和BST / HR-Si结构的418.53和101.68相比,BST / TiO {sub} 2 / HR-Si结构的品质因数提高了504.4。

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