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ANALYSIS OF FREQUENCY RESPONSE OF WIRE BOND CONFIGURATIONS JOINING TWO 50-X MICROSTRIP LINES

机译:两条两条50-X微带线的线键结配置的频率响应分析

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摘要

Small to medium length wirebond interconnects, which range approximately from 300 to 660 lm are investigated. Wirebond S-parameters are measured using a parametric vector network analyzer with respect to a 50-Ω system. Results show that there is degrading performance with increasing wirebond length and decreasing number of bonds.
机译:研究了小到中等长度的引线键合互连,其范围从300到660 lm。对于50Ω系统,使用参量矢量网络分析仪测量引线键合S参数。结果表明,随着引线键合长度的增加和键合数量的减少,性能会下降。

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