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首页> 外文期刊>Microwave and optical technology letters >INVESTIGATION OF RETURN LOSS FOR LARGE NUMBERS OF BONDING WIRES BY FDTD METHOD
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INVESTIGATION OF RETURN LOSS FOR LARGE NUMBERS OF BONDING WIRES BY FDTD METHOD

机译:用FDTD方法研究大量束缚线的回波损耗

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The finite-difference time domain (FDTD) model is validated first by comparing the simulation results of return losses for 1, 7, and 15 bonding wires fabricated on a test board with those obtained by the HFSS software. After checking its accuracy, the FDTD method is used to investigate the return loss for bonding wire arrays with numerous geometrical parameters. From simulation results, it is found that the return loss of bonding wires can be improved by using multiple wires placed in parallel in bonding wire arrays. It is also found that operation frequency shifts of bonding wire arrays can be achieved by changing the wire numbers in bonding wire arrays. It is also reveled that the return loss of bonding wire structures is a function of the bonding wire geometry, such as the spacing between adjacent wires, wire number, wire height above the substrate, and wire length.
机译:首先通过将测试板上制造的1条,7条和15条键合线的回波损耗仿真结果与HFSS软件获得的回波损耗的仿真结果进行比较,来验证有限差分时域(FDTD)模型。在检查其准确性之后,使用FDTD方法研究具有众多几何参数的键合线阵列的回波损耗。从仿真结果发现,通过在焊线阵列中并联放置多条焊线,可以改善焊线的回波损耗。还发现可以通过改变键合线阵列中的线号来实现键合线阵列的操作频率偏移。还揭示了键合线结构的回波损耗是键合线几何形状的函数,例如相邻线之间的间距,线号,基板上方的线高和线长。

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