Force Scanning for Simultaneous Collection of Topographical and Mechanical Properties

摘要

Atomic force microscopy can be used to co-localize mechanical properties and topographical features through property mapping techniques. However, standard approaches such as force mapping can be limited by long testing times and low spatial resolution. Force scanning is a straight-forward methodology applicable to a wide range of materials and testing environments, requiring no special modification to standard AFMs. Biologically relevant demonstrations are presented for high-resolution modulus mapping of individual cells, cell-cell interfaces, and articular cartilage tissue.