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An improved Wiener deconvolution filter for high-resolution electron microscopy images

机译:用于高分辨率电子显微镜图像的改进的维纳反卷积滤波器

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We propose an improved Wiener deconvolution filter for high-resolution transmission electron microscopy (HRTEM) images and apply it to an experimental graphite image. The improved filter can simultaneously eliminate the modulation transfer function effects of CCD cameras and reduce noise, thereby confirming its superiority over the general Wiener deconvolution and Wiener denoising filters. In the resulting image, graphene lattices appear. In particular, because of our on-estimation of the noise power spectrum, the vacuum remains naturally smooth and very clear graphene-vacuum boundaries generates. Quantitatively, the signal-to-noise ratio of the filtered image improves by a factor of 3. The proposed method is applicable to very noisy HRTEM images of weak scattering objects, such as few-layer graphene or boron nitride.
机译:我们为高分辨率透射电子显微镜(HRTEM)图像提出了一种改进的维纳反卷积滤波器,并将其应用于实验性石墨图像。改进的滤波器可以同时消除CCD相机的调制传递函数效应并减少噪声,从而证实了其优于一般的Wiener反卷积和Wiener去噪滤波器。在所得图像中,出现石墨烯晶格。特别地,由于我们对噪声功率谱的估计,真空自然保持平滑,并且产生非常清晰的石墨烯-真空边界。从数量上说,滤波后图像的信噪比提高了3倍。该方法适用于弱散射物体(如几层石墨烯或氮化硼)的高噪声HRTEM图像。

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