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首页> 外文期刊>Metrologia: International Journal of Scientific Metrology: = Internationale Zeitschrift fur Wissenschaftliche Metrologie: = Journal International de Metrologie Scientifique >Monitoring large-aperture spherical integrating sources with a portable radiometer during satellite instrument calibration
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Monitoring large-aperture spherical integrating sources with a portable radiometer during satellite instrument calibration

机译:在卫星仪器校准过程中使用便携式辐射计监控大孔径球面积分源

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摘要

A National Institute of Standards and Technology (NIST)-designed radiometer is being used to monitor the spherical integrating sources (SISs) used to radiometrically calibrate the Enhanced Thematic Mapper Plus (TM+), an Earth-imaging sensor on the Landsat-7 satellite. This six-channel Landsat Transfer Radiometer (LXR) uses witness filter samples from the first four bands of the ETM+ along with two 10 nm bandpass filters centred at 1441 nm and 662 nm. The ETM+ band I is 450 nm to 515 nm; band 2 is 525 nm to 600 nm; band 3 is 630 nm to 690 nm and band 4 is 775 nm to 900 nm. This monitor aids in characterizing the ETM+ stability with time and also provides an alternate radiometric scale for calibration. LXR measurements, which are taken off-axis while the ETM+ views the SIS on-axis, have documented changes as large as 7 % in the SIS outputs in some of the ETM+ bandpasses. The ETM+ responses to the SIS have changed comparably, demonstrating ETM+ stability to within about l %. LXR measurements have also shown that the linearity of the ETM+ response to radiance is about an order of magnitude better than that possible without the simultaneous measurements.
机译:美国国家标准技术研究院(NIST)设计的辐射计正用于监视球形积分源(SIS),该球形积分源用于辐射校准Landsat-7卫星上的地球成像传感器Enhanced Thematic Mapper Plus(TM +)。这款六通道Landsat传输辐射计(LXR)使用来自ETM +前四个波段的见证滤镜样本以及两个以1441 nm和662 nm为中心的10 nm带通滤镜。 ETM +带I为450 nm至515 nm;带2是525nm至600nm;带3为630nm至690nm,带4为775nm至900nm。该监视器有助于表征ETM +随时间变化的稳定性,并且还提供了替代的辐射刻度进行校准。 LXR测量值是在ETM +同轴观察SIS时离轴进行的,已记录了某些ETM +带通中SIS输出中高达7%的变化。 ETM +对SIS的响应发生了相当的变化,表明ETM +的稳定性在大约1%之内。 LXR测量还显示,ETM +对辐射的响应的线性度比没有同时进行测量的线性度好大约一个数量级。

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