首页> 外文期刊>Metrologia: International Journal of Scientific Metrology: = Internationale Zeitschrift fur Wissenschaftliche Metrologie: = Journal International de Metrologie Scientifique >Wavelength-scanning calibration of detection efficiency of single photon detectors by direct comparison with a photodiode
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Wavelength-scanning calibration of detection efficiency of single photon detectors by direct comparison with a photodiode

机译:通过与光电二极管直接比较,对单光子探测器的探测效率进行波长扫描校准

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摘要

We present a practical calibration method of the detection efficiency (DE) of single photon detectors (SPDs) in a wide wavelength range from 480 nm to 840 nm. The setup consists of a GaN laser diode emitting a broadband luminescence, a tunable bandpass filter, a beam splitter, and a switched integrating amplifier which can measure the photocurrent down to the 100 fA level. The SPD under test with a fibre-coupled beam input is directly compared with a reference photodiode without using any calibrated attenuator. The relative standard uncertainty of the DE of the SPD is evaluated to be from 0.8% to 2.2% varying with wavelength (k = 1).
机译:我们提出了一种实用的校准方法,用于在480 nm至840 nm的宽波长范围内的单光子探测器(SPD)的探测效率(DE)。该装置包括一个发出宽带发光的GaN激光二极管,一个可调带通滤波器,一个分束器和一个开关积分放大器,可以测量低至100 fA的光电流。在不使用任何校准衰减器的情况下,将具有光纤耦合光束输入的被测SPD直接与参考光电二极管进行比较。随波长(k = 1)变化,SPD的DE的相对标准不确定度估计为0.8%至2.2%。

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