Microstructural characterization by EBSD of Ti-6Al-4V alloy with a SiC/Cr layer deposited by HiPIMS process before and after the creep tests

摘要

The application of a SiC/Cr film in Ti-6Al-4V alloy for the aerospace industry aims to chemically protect the action of oxygen in the titanium alloy, and to increase the creep life and fracture time and reduce the creep rate of plastic deformation alloy compared to unprotected alloy. The objective of this work was to investigate and evaluate the microstructural evolution, texture and crystal correlations of the Ti-6Al-4V alloy coated with SiC/Cr film by High Power Impulse Magnetron Sputtering (HiPIMS) before and after creep tests. The creep tests performed at temperatures of 500, 600 and 650 degrees C, in constant load mode stresses of 125, 250 and 319 MPa. The analyses of the samples were carried out by means of scanning electron microscopy (SEM) using the technique of backscattered electron diffraction (EBSD) and energy dispersion X-ray spectroscopy (EDS). The EBSD results on Ti-6Al-4V alloy were identified that there were microstructural changes and texture for a set of preferred orientations that with increased the creep test load stresses, the Ti-alpha and Ti-beta phases texturization increases.