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首页> 外文期刊>Metallurgical and Materials Transactions, A. Physical Metallurgy and Materials Science >In-Situ Fracture Observation and Fracture Toughness Analysis of Zr-Based Amorphous Alloys Containing Ductile Dendrites
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In-Situ Fracture Observation and Fracture Toughness Analysis of Zr-Based Amorphous Alloys Containing Ductile Dendrites

机译:含延性枝晶的Zr基非晶合金的原位断裂观察和断裂韧性分析

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摘要

Effects of dendrite size on fracture properties of Zr-based amorphous alloys containing ductile fi dendrites were explained by directly observing microfracture processes using an in-situ loading stage installed inside a scanning electron microscope (SEM) chamber. Three amorphous alloy plates having different thicknesses were fabricated by varying cooling rates after vacuum arc melting. The effective size of fi dendrites was varied from 14.7 to 30.1 μm in the alloy plates, while their volume fraction was almost constant. According to microfracture observation of the alloy containing fine fi dendrites, shear bands initiated at the amorphous matrix were connected with the notch tip as they were deepened through dendrites, which led to abrupt crack propagation. In the alloy containing coarser fi dendrites, shear bands were initiated at the amorphous matrix to form a crack near the notch tip region and were expanded over large matrix areas. The crack propagation was frequently blocked by fi dendrites, and many shear bands are formed near or in front of the propagating crack, thereby resulting in stable crack growth, which could be confirmed by the fracture resistance curve (it-curve) behavior. This increase in fracture resistance with increasing crack length could be explained by mechanisms of blocking of crack growth, multiple shear band formation, and crack blunting.
机译:通过使用安装在扫描电子显微镜(SEM)室内的原位加载台直接观察微断裂过程,可以解释枝晶尺寸对含延性纤晶的Zr基非晶合金断裂性能的影响。通过改变真空电弧熔化后的冷却速率来制造具有不同厚度的三块非晶合金板。合金板中树枝状晶体的有效尺寸从14.7微米变化到30.1微米,而它们的体积分数几乎恒定。根据对含有细微树枝状晶体的合金的微裂纹观察,当非晶态基质中的剪切带通过树枝状晶体加深时,在非晶基体上产生的剪切带与缺口尖端相连,从而导致裂纹突然扩展。在含有较粗的树枝状晶体的合金中,在非晶基体上产生了剪切带,在缺口尖端区域附近形成了一条裂纹,并在较大的基体区域上扩展。裂纹经常被树枝状晶体阻止,并且在扩展的裂纹附近或前方形成许多剪切带,从而导致稳定的裂纹扩展,这可以通过抗断裂曲线(it-curve)的行为来证实。随裂纹长度增加而增加的抗断裂性可以用裂纹扩展的阻塞,多剪切带形成和裂纹钝化的机理来解释。

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