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机译:
机译:Characterization of oxide layers on amorphous Mg-based alloys by Auger electron spectroscopy with sputter depth profiling
机译:Auger electron spectroscopy sputter depth profiling technique for binary solids
机译:Depth profile investigations of metallic layer contacts to GaAs(100) and InP(100) by means of Auger Electron Spectroscopy and sputter technique