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机译:Characterization of oxide layers on amorphous Mg-based alloys by Auger electron spectroscopy with sputter depth profiling
Leibniz-Institut fur Festkorper- und Werkstofforschung Dresden, Postfach 270016, 01171 Dresden, Germany;
Indira Ghandi Centre for Atomic Research, 603 102 Kalpakkam, Tamil Nadu, India;
amorphous metal; auger electron spectroscopy; depth profiling;