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Photovoltaic properties of CdTep‐njunctions produced by ion implantation

机译:离子注入产生的CdTep连字符的光伏特性

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A surface region about 0.22 mgr;m thick of cadmium‐annealed undopedn‐type CdTe single crystal was converted toptype by implantation of 60‐keV As+ions followed by a cadmium annealing. The electrical properties of thep‐type layer were measured as well as the photovoltaic properties of thep‐njunction formed in this way. For illumination by sunlight an open‐circuit voltage of 0.84 V was found in a cell with a solar efficiency of 3.0percent;. The parameters of the junction were determined using a model designed to describe the spectral response of the cell.
机译:通过注入60&连字符;KeV As+离子,然后进行镉退火,将约0.22&mgr;m厚的镉&连字符&连字符;型CdTe单晶的表面区域转换为顶型。测量了 p‐型层的电学性能以及以这种方式形成的 p‐njunction 的光伏性能。对于阳光照射,在太阳能效率为3.0%的电池中发现了0.84 V的开路&连字符;电路电压。使用旨在描述电池光谱响应的模型确定结的参数。

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