Data retention characteristics of Bi_(3.25)La_(0.75)Ti_(3)O_(12) thin films on conductive SrRuO_(3) electrodes

摘要

Ferroelectric Bi_(3.25)La_(0.75)Ti_(3)O_(12) (BLT) thin films were deposited on SrRuO_(3) (SRO) and Pt electrodesby pulsed laser deposition. The data retention characteristics of the BLT films on different electrode materials were characterized. The experimental results are well fitted by a stretched exponential decay model, indicating that BLT films on both Pt and SRO exhibit the similar decay mechanisms. However, the decay behavior is quite different due to the use of different bottom electrodes. The superior data retention performance of BLT film on conductive SRO electrode is believed to be from the reduction of domain polarization backswitching originated from the oxygen vacancies in the depletion region of BLT films.