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EPR studies on amorphous Ge‐Al and Ge‐Cu films

机译:非晶态Ge‐Al和Ge‐Cu薄膜的EPR研究

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摘要

Electron paramagnetic resonance in amorphous germanium (a‐Ge) alloy films containing varying concentrations of Al and Cu has been studied. The concentration of free spins (dangling bonds) is found to decrease rapidly on alloying to less than 5×1017/cm3for about 8 at.percent; Al and 10 at.percent; Cu concentrations. Thegfactor and line shape remain unaffected on alloying. The linewidth, however, shows minor changes.
机译:研究了含有不同浓度Al和Cu的非晶态锗(a‐Ge)合金薄膜中的电子顺磁共振。发现自由自旋(悬空键)的浓度在合金化时迅速降低到低于 5×1017/cm3,铝浓度约为 8 at.&% 和 10 at.&% Cu。系数和线形在合金化时不受影响。但是,线宽显示细微变化。

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