Electrostatically self-assembled multilayers of chitosan and xanthan studied by Atomic Force Microscopy and micro-interferometry

摘要

The thickness and surface morphology of electrostatically self-assembled films of chitosan and xanthan (persistence length of similar to 120nm) have been studied using dual-wavelength Reflection Interference Contrast Microscopy (DW-RICM) and tapping mode Atomic Force Microscopy (AFM). The multilayers were prepared at two ionic strengths (5mM and 150mM). When the multilayers were assembled at 150 mM a network like morphology was observed after one bilayer. This structure was found to be of large influence in the further growth of the multilayers, with the same kind of network structure being observed at all number of bilayers. A lack of swelling behaviour, as well as the network structure and the poresize of the network, is suggested to originate from the high chain stiffness of xanthan.