Phase-separation-induced surface patterns in thin polymer blend films

摘要

Atomic force microscopy (AFM), neutron reflection (NR) and secondary ion mass spectroscopy (SIMS) are used to examine phase separation in symmetrically segregating thin polymer blend films (less than or equal to 1000 Angstrom). Phase separation in the film leads to undulations of the liquid-air interface, provided the film is sufficiently thin to suppress surface-directed spinodal decomposition waves. Flattened droplets are formed at a very late stage of phase separation, and the aspect ratio of these droplets can be rationalized by an interfacial free energy minimization argument. [References: 38]