首页> 外文期刊>Fresenius' Journal of Analytical Chemistry >Studies on the determination of trace elements in high-purity Sb using GFAAS and ICP-QMS
【24h】

Studies on the determination of trace elements in high-purity Sb using GFAAS and ICP-QMS

机译:石墨炉原子吸收光谱法和ICP-QMS法测定高纯锑中微量元素的研究

获取原文
获取原文并翻译 | 示例
           

摘要

Trace element impurities in high-purity antimony were determined employing three different methods for the removal of matrix; on Dowex 50WX 8 by adsorption from 0.1 mol/L HF and elution with 4 mol/L HNO_3; on Chelex-100 resin (in NH_4~+ form) Bi, Cd, Co, Cu, and Pb were separated in the presence of tartaric acid at a pH of 9.0 +- 0.1 with subsequent elution with 2 mol/L HCl; these determinations were carried out by GFAAS. The separation of trace impurities from Sy by volatilization of the matrix from H_2SO_4 and HBr medium was also investigated. ICP-MS was used for the determination in these cases. All the three procedures showed that the removal of the antimony matrix was nearly quantitative (> 99.99%). The recoveries of trace elements were found to be > 95%. The relative standard deviations were in the range 2-7%. Standard addition calibrations were used. The levels of process blanks indicate that with careful optimization, the volatilization procedure coupled with ICP-QMS can be used for trace impurity characterization of 6N + Sb.
机译:采用三种不同的去除基质的方法测定了高纯度锑中的痕量元素杂质。在Dowex 50WX 8上,通过0.1 mol / L HF吸附并用4 mol / L HNO_3洗脱;在Chelex-100树脂(NH_4〜+形式)上,在酒石酸存在下,pH 9.0±-0.1下分离Bi,Cd,Co,Cu和Pb,随后用2 mol / L HCl洗脱;这些测定是由GFAAS进行的。还研究了通过从H_2SO_4和HBr介质中挥发掉基质而从Sy中分离出微量杂质的方法。在这些情况下,使用ICP-MS进行测定。所有这三个过程均表明,锑基质的去除几乎是定量的(> 99.99%)。微量元素的回收率> 95%。相对标准偏差在2-7%的范围内。使用标准添加校准。工艺空白的水平表明,通过精心优化,将挥发过程与ICP-QMS结合可用于6N + Sb的痕量杂质表征。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号