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首页> 外文期刊>Fresenius' Journal of Analytical Chemistry >Investigations on the use of chemical modifiers for the direct determination of trace impurities in Al_2O_3 cermic powders by slurry electrothermal evaporation coupled with inductively-coupled plasma mass spectrometry (ETV-ICP-MS)
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Investigations on the use of chemical modifiers for the direct determination of trace impurities in Al_2O_3 cermic powders by slurry electrothermal evaporation coupled with inductively-coupled plasma mass spectrometry (ETV-ICP-MS)

机译:浆料电热蒸发-电感耦合等离子体质谱法(ETV-ICP-MS)用于化学修饰剂直接测定Al_2O_3陶瓷粉中痕量杂质的研究

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The direct determination of trace impurities in Al_2O_3 ceramic basic powders by ICP-MS using electrothermal evaporation (ETV) with slurry sampling has been investigated. To increase interference-free analyte volatilization, the use of the palladium-group modifiers (PGM) IrCl_3,Pd(NO_3)_2,and PdCl_2 for the determination of Ca,Fe,Ga,Mg,Mn,Na,Ni,and V in Al_2O_3 powders was studied. Their role,whioch in ETV-KCP-MS and ETV-ICP-OES is to stabilize the investigated analye during the ashing phase,to increase vaporization of the matrix,and to reduce transport losses was investigated.Optimum analysis results were obtained with PdCl_2 modifier when 500 ng Pd was used for a sample weight of 100 #mu#g Al_2O_3 injected into the ETV. Calibration was perfoemed by standard addition with aqueous solutions of the analytes. The RSDs calculated from triplicate analysis ranged form 5 to 10%. Detection limits between 0.07 #mu#g g~(-1) (Ga) and 1.1 #mu#g g~(-1) (Na) were achieved. The accuracy was proven for the elements Ca,Fe,Ga,Mg,Mn,Na,Ni,and V by analyzing an NIST standard reference Al_2O_3 material (SRM 699) with a middle grain size of 16.4 #mu#m..The analytical method was used for the analysis of Al_2O_3 powder (AKP 30,Sumitomo,Japan) with impurities in the low #mu#g g~(-1) range and a grain size of 1.1 #mu#m. The results obtained for the elements Ca,Fe,Ga,Mg,Mn,Na,Ni,and V were comoparable with those obtained by ICP-MS subsequent to conventional decomposition with hydrochloric acid high pressure.
机译:研究了采用电热蒸发(ETV)和浆液采样的ICP-MS直接测定Al_2O_3陶瓷基粉中的痕量杂质。为了增加分析物的无干扰挥发度,使用钯基修饰剂(PGM)IrCl_3,Pd(NO_3)_2和PdCl_2测定水中的Ca,Fe,Ga,Mg,Mn,Na,Ni和V研究了Al_2O_3粉末。它们在ETV-KCP-MS和ETV-ICP-OES中的作用是在灰化阶段稳定所研究的茴香醚,增加基质的汽化并减少运输损失。使用PdCl_2改性剂可获得最佳分析结果当将500 ng Pd用于样品重量为100#mu#g Al_2O_3注入到ETV中时。通过添加分析物的水溶液进行标准校准。根据三次分析计算得出的RSD范围为5%至10%。检出限在0.07#mu#g g〜(-1)(Na)和1.1#mu#g g〜(-1)(Na)之间。通过分析中等晶粒度为16.4#mu#m的NIST标准参考Al_2O_3材料(SRM 699),证明了元素Ca,Fe,Ga,Mg,Mn,Na,Ni和V的准确性。方法用于分析Al_2O_3粉末(日本住友,AKP 30),杂质含量在#mu#gg〜(-1)范围低,晶粒尺寸为1.1#mu#m。元素Ca,Fe,Ga,Mg,Mn,Na,Ni和V的结果可与常规用盐酸高压分解后通过ICP-MS获得的结果相比。

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