MECHANISM AND CONTROLLING OF SILVER MIGRATION IN COFIRED MULTILAYER DEVICES WITH AG-PD INNER ELECTRODES

摘要

The silver migration in cofired multilayer ceramic devices with Ag-Pd electrodes has been a serious concern for their reliability and electrical properties with much thinner tapes produced. This paper presents the investigation on the mechanism of silver migration by cofiring experiments between PMZNT ceramics and Ag-Pd electrodes. The results showed that the rapid transport of silver near the interface was basically attributed to vapor-phase diffusion mechanism. Silver in electrodes could migrate into the ceramics via open pores on the surface of ceramics in the early period of sintering. The interfacial diffusion of silver could be restricted by modified compositions and sintering processes.