Optical Second Harmonic Generation for Determination the Domain Orientation in Thin Ferroelectric Films

摘要

A simple nonlinear optical technique is suggested to measure the ratio of in-plane and Z-oriented domains in thin ferroelectric films, which is based on measurements of the SHG intensity as a function of the angle of incidence. From the interference patterns arising from multiple reflections qualitative information about the domain coherence can be obtained, a factor that might be important for electrical properties of the film.