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首页> 外文期刊>European journal of mass spectrometry >Letter: A simple ion source set-up for desorption/ionization on silicon with ion mobility spectrometry and ion mobility spectrometry-mass spectrometry
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Letter: A simple ion source set-up for desorption/ionization on silicon with ion mobility spectrometry and ion mobility spectrometry-mass spectrometry

机译:信:利用离子迁移谱和离子迁移谱-质谱法在硅上进行解吸/电离的简单离子源装置

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摘要

Using a simple ion source set-up, laser desorption/ionization on silicon (DIOS) was demonstrated with the use of a custom-made drift tube ion mobility spectrometer (IMS), mounted on a commercial triple quadrupole mass spectrometer, and with an IMS equipped with a Faraday plate detector. DIOS was tested by mobility measurement of tetrapropylammonium iodide, tetrabutylammonium iodide and tetrapentylammonium iodide, whilst 2,6-di-tert-butylpyridine was used as a standard. The reduced mobilities measured for the test halides are in concordance with previously obtained ion mobility spectrometry-mass spectrometry data.
机译:使用简单的离子源设置,使用安装在商用三重四极杆质谱仪上的定制漂移管离子迁移谱仪(IMS)演示了硅上的激光解吸/电离(DIOS)装有法拉第平板检测器。通过对四丙基碘化铵,四丁基碘化铵和四戊基碘化铵的迁移率测量来测试DIOS,而2,6-二叔丁基吡啶为标准品。对于测试卤化物测得的降低的迁移率与先前获得的离子迁移谱-质谱数据一致。

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