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Principles and Applications of Force Spectroscopy Using Atomic Force Microscopy

机译:原子力显微镜的力谱原理和应用

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摘要

Single-molecule force spectroscopy is a powerful technique for addressing single molecules. Unseen structures and dynamics of molecules have been elucidated using force spectroscopy. Atomic force microscope (AFM)-based force spectroscopy studies have provided picoNewton force resolution, subnanometer spatial resolution, stiffness of substrates, elasticity of polymers, and thermodynamics and kinetics of single-molecular interactions. In addition, AFM has enabled mapping the distribution of individual molecules in situ, and the quantification of single molecules has been made possible without modification or labeling. In this review, we describe the basic principles, sample preparation, data analysis, and applications of AFM-based force spectroscopy and its future.
机译:单分子力光谱法是解决单分子的强大技术。使用力谱已经阐明了分子的看不见的结构和动力学。基于原子力显微镜(AFM)的力谱研究提供了picoNewton力分辨率,亚纳米空间分辨率,基底刚度,聚合物弹性以及单分子相互作用的热力学和动力学。此外,AFM能够原位绘制单个分子的分布图,并且无需修饰或标记就可以对单个分子进行定量。在这篇综述中,我们描述了基于原子力显微镜的力谱学的基本原理,样品制备,数据分析,应用及其未来。

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