X-ray photoelectron spectroscopy possibilities for analyzing the structural state of thin layers of oxide nanomaterials

Kanunnikova O.M.; Karban O.V.

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X-ray photoelectron spectroscopy possibilities for analyzing the structural state of thin layers of oxide nanomaterials

机译：X射线光电子能谱分析氧化物纳米材料薄层结构状态的可能性

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摘要

A method is developed that enables us to enhance the capabilities of photoelectron spectroscopy to obtain data on the atomic structure of thin layers of oxide materials.

机译：开发了一种方法，使我们能够增强光电子光谱学的能力，以获取有关氧化物材料薄层的原子结构的数据。

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《Bulletin of the Russian Academy of Sciences. Physics》 |2011年第11期|共6页
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Kanunnikova O.M.; Karban O.V.;
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正文语种 eng
中图分类物理学;
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专利

1. X-ray photoelectron spectroscopy possibilities for analyzing the structural state of thin layers of oxide nanomaterials [J] . Kanunnikova O.M., Karban O.V. Bulletin of the Russian Academy of Sciences. Physics . 2011,第11期

机译：X射线光电子能谱分析氧化物纳米材料薄层结构状态的可能性
2. X-ray photoelectron spectroscopy on uranium oxides: a comparison between bulk and thin layers [J] . den Berghe S., Gouder T., Gaudreau B., Journal of Nuclear Materials: Materials Aspects of Fission and Fusion . 2001,第1a2期

机译：铀氧化物的X射线光电子能谱：体层和薄层之间的比较
3. Evidence of reduced species in molybdenum oxide-phenanthroline layered hybrids from structural, magnetic and X-ray photoelectron spectroscopy studies [J] . Chong Shen V., Jameson Geoffrey B., Islah-u-din, Materials Letters . 2018,第NOVa15期

机译：从结构，磁和X射线光电子能谱研究中发现氧化钼-菲咯啉层状杂种中还原物种的证据
4. Using ellipsometry and x-ray photoelectron spectroscopy for real-time monitoring of the oxidation of aluminum mirrors protected by ultrathin MgF_2 layers [C] . Brian I. Johnson, Tahereh G. Avval, Grant T. Hodges, Astronomical Optics: Design, Manufacture, and Test of Space and Ground Systems . 2019

机译：使用椭圆形和X射线光电子能谱进行实时监测超薄MGF_2层保护的铝镜氧化
5. Hard X-ray Standing-Wave Photoelectron Spectroscopy Study of Cobalt-Iron-Boron/Magnesium Oxide Magnetic Tunnel Junction Multilayers. [D] . Greer, Albert Anthony. 2013

机译：钴-铁-硼/氧化镁磁性隧道结多层膜的硬X射线驻波光电子能谱研究。
6. X-ray photoelectron spectroscopy of graphitic carbon nanomaterials doped with heteroatoms [O] . Toma Susi, Thomas Pichler, Paola Ayala 2015

机译：杂原子掺杂石墨碳纳米材料的X射线光电子能谱
7. Thickness determination of thin oxide layers on metal surfaces using X-ray photoelectron spectroscopy. [O] . Kazuaki OKUDA, Akio ITOH 1991

机译：X射线光电子能谱厚度测定金属表面上的薄氧化物层。

X-ray photoelectron spectroscopy possibilities for analyzing the structural state of thin layers of oxide nanomaterials

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