首页> 外文期刊>Bulletin of the Russian Academy of Sciences. Physics >ANALYSIS OF ACOUSTIC WAVE FIELDS IN La3Ga5SiO14 CRYSTALS USING X-RAY TOPOGRAPHY
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ANALYSIS OF ACOUSTIC WAVE FIELDS IN La3Ga5SiO14 CRYSTALS USING X-RAY TOPOGRAPHY

机译:X射线断层扫描法分析La3Ga5SiO14晶体中的声波场。

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摘要

Fields of standing surface acoustic waves (SAVs) in X-, Y-, and (022)-cuts of lanthanum gallium silicate crystal (La3Ga5SiO14, lan-gasite, LGS) were studied using high-resolution X-ray topography. SAV amplitudes and power flow angles were determined. The influence of crystal structure defects (twins, block structures, growth bands, and .F-centers) on propagation of ultrasonic superlattices was studied. It was shown that only twins and jF-centers result in strong distortions of acoustic wave fields in LGS crystals.
机译:使用高分辨率X射线形貌研究了镧硅酸镓镓晶体(La3Ga5SiO14,lan-gasite,LGS)的X,Y和(022)切面中的驻表面声波(SAV)场。确定了SAV振幅和功率流角。研究了晶体结构缺陷(孪晶,块结构,生长带和.F中心)对超声超晶格传播的影响。结果表明,只有孪晶和jF中心会导致LGS晶体中的声波场发生严重畸变。

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