X line-segment light measuring method for phase-analysis measurement apparatus, involves determining absolute wavelength of X-ray from difference of crystal rotation angle in each positions of channel cut crystal for spectroscopy

摘要

The method involves diffracting X-ray at each positions (-,+) and (+,-) of channel cut crystal (20) for spectroscopy, for forming cut surfaces (11a,12a,21a,22a). The absolute wavelength of the X-ray is determined from the difference of crystal rotation angle in each position. An independent claim is included for X line-segment optical device.