QUADROELLIPTICAL REFLECTOR BASED ON MULTILAYER STRUCTURES FOR HARD X-RAY RANGE

摘要

We considered a method for fabricating a reflecting system to focus hard X-rays of a quasi-point source in the wavelength range λ ≤ 0.1 nm, as well as its characteristics. The system consisted of four identical multilayer mirrors shaped as an elliptic cylinder. Generatrices of neighboring mirrors were mutually perpendicular. The angular aperture of the system was ΔΩ = 1.8·10~(-3) sr.