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Measuring a charge-coupled device point spread function Euclid visible instrument CCD273-84 PSF performance

机译:测量电荷耦合器件的点扩散函数Euclid可见仪器CCD273-84 PSF性能

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In this paper we present the testing of a back-illuminated development Euclid Visible Instrument (VIS) Charge-Coupled Device (CCD) to measure the intrinsic CCD Point Spread Function (PSF) characteristics using a novel modelling technique. We model the optical spot projection system and the CCD273-84 PSF jointly. We fit a model using Bayesian posterior probability density function, sampling to all available data simultaneously. The generative model fitting is shown, using simulated data, to allow good parameter estimations even when these data are not well sampled. Using available spot data we characterise a CCD273-84 PSF as a function of wavelength and intensity. The CCD PSF kernel size was found to increase with increasing intensity and decreasing wavelength.
机译:在本文中,我们介绍了一种使用新型建模技术的背照式显影欧几里得可见仪器(VIS)电荷耦合器件(CCD)的测试,以测量固有CCD点扩展函数(PSF)特性。我们共同对光学点投影系统和CCD273-84 PSF进行建模。我们使用贝叶斯后验概率密度函数拟合模型,同时对所有可用数据进行采样。使用模拟数据显示了生成模型拟合,即使没有对这些数据进行很好的采样,也可以进行良好的参数估计。利用可用的斑点数据,我们将CCD273-84 PSF表征为波长和强度的函数。发现CCD PSF内核尺寸随强度增加和波长减小而增加。

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