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Heteropitaxial growth of III-V compound semiconductors for optoelectronic devices

机译:光电子器件中III-V族化合物半导体的异质外延生长

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An AlGaAs/GaAs multi-quantum well vertical-cavity surface-emitting laser diode (VCSELD) has been grown ona Si substrate using metalorganic chemical vapour deposition(MOCVD). The VCSELD with a 23-pair of AlAs/Al0.1Ga0.9Asdistributed Bragg reflector on a Si substrate exhibited a thresholdcurrent of 223 mA under continuous-wave condition at 220 K.Electroluminescence observation showed that an opticaldegradation was caused by generation and growth of dark-linedefects. An MOCVD-grown InGaN/AlGaN double-heterostructure light-emitting diode on a sapphire substrateexhibited an optical output power of 0.17mW, an externalquantum efficiency of 0.2%, a peak emission wavelength at 440nm with a full width at half-maximum of 63 nm and a stableoperation up to 3000h under 30mA DC operation at 30℃. Ahigh current level of 281 mA/mm and a largetransconductance (gm)of 33mS/mm have been achievedfor a GaN metal semiconductor field-effecttransistor (MESFET) with a gate length of 2μm anda width of 200μm at 25℃. The GaN MESFET at 400℃showed degraded characteristics: a low gm of13.4mS/mm, a gate leakage and a poor pinch-off.
机译:利用金属有机化学气相沉积(MOCVD)技术在硅衬底上生长了AlGaAs / GaAs多量子阱垂直腔面发射激光二极管(VCSELD)。在Si衬底上具有23对AlAs / Al0.1Ga0.9As分布的Bragg反射器的VCSELD在220 K连续波条件下的阈值电流为223 mA。电致发光观察表明,光降解是由暗光的产生和生长引起的线缺陷。蓝宝石衬底上的MOCVD生长的InGaN / AlGaN双异质结构发光二极管的光输出功率为0.17mW,外部量子效率为0.2%,峰值发射波长为440nm,半峰全宽为63nm。在30℃30mA DC下稳定运行3000h。在25℃下,栅长为2μm,宽为200μm的GaN金属半导体场效应晶体管(MESFET)已实现了281 mA / mm的高电流水平和33mS / mm的大跨导(gm)。 GaN MESFET在400℃时表现出退化的特性:低gm为13.4mS / mm,栅极泄漏和夹断不良。

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