The non-linearity and the noise of thick-film resistors are parameters that can be used to make a prediction of resistor reliability. The noise spectroscopy measurements of thick-film resistors are proposed as a diagnostic tool for the prediction of possible types of failure. The correlation between noise spectral density data and the results of accelerated aging of thick-film resistors at high temperature were made for HS80 and 2000 resistor pastes.
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