首页> 外文期刊>Engineering Fracture Mechanics >Fatigue crack growth analysis of T junction under biaxial compressive-compressive loads
【24h】

Fatigue crack growth analysis of T junction under biaxial compressive-compressive loads

机译:双轴压缩-压缩载荷下T型接头疲劳裂纹扩展分析

获取原文
获取原文并翻译 | 示例
           

摘要

The objective of the present research is to analyze systematically the effect of biaxial compressive-compressive stresses on crack growth behavior of T junctions. Pressure structures have many components which are designed to be compressively stressed. This paper describes and summarizes biaxial compressive fatigue crack initiation and propagation characteristics through several T junctions under biaxial fatigue tests. Unlike uniaxial compressive fatigue, multiaxial compressive-compressive fatigue has the intricate characteristics of multi-point crack initiating, short crack group growth behavior and long crack propagating behavior. Moreover, the effective stress intensity factor range K-eff and the crack opening threshold K-op,K-max are used to explain the crack growth under biaxial loads instead of the Paris law. Predictions of fatigue crack growth behavior based on the extended McEvily formula agree well with experimental observations. (C) 2015 Elsevier Ltd. All rights reserved.
机译:本研究的目的是系统地分析双轴压缩-压缩应力对T型接头裂纹扩展行为的影响。压力结构具有许多设计成受压应力的组件。本文描述并总结了双轴压缩疲劳裂纹在双轴疲劳试验中通过多个T形接头的萌生和扩展特性。与单轴压缩疲劳不同,多轴压缩压缩疲劳具有多点裂纹萌生,短裂纹群增长行为和长裂纹扩展行为的复杂特征。此外,有效应力强度因子范围K-eff和开裂阈值K-op,K-max用于解释双轴载荷下的裂纹扩展,而不是使用巴黎定律。基于扩展的McEvily公式的疲劳裂纹扩展行为的预测与实验观察非常吻合。 (C)2015 Elsevier Ltd.保留所有权利。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号