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An investigation of fractal characteristics of mesoporous carbon electrodes with various pore structures

机译:不同孔结构的介孔碳电极的分形特性研究

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Fractal characteristics of mesoporous carbon electrodes were investigated with various pore structures using the N{sub}2 gas adsorption method and the transmission electron microscopy (TEM) image analysis method. The mesoporous carbons with various pore structures were prepared by imprinting mesophase pitch used as a carbonaceous precursor with different colloidal silica particles. All imprinted mesoporous carbons were composed of two groups of pores produced from the carbonisation of mesophase pitch and from the silica imprinting. The overall surface fractal dimensions of the carbon specimens were determined from the analyses of the N{sub}2 gas adsorption isotherms. In order to distinguish the surface fractal dimension of the carbonisation-induced pore surface from that fractal dimension of the silica-imprinted pore surface, the individual surface fractal dimensions were determined from the image analyses of the TEM images. From the comparison of the overall surface fractal dimension with the individual surface fractal dimensions, it was recognised that the overall surface fractal dimension is crucially influenced by the individual surface fractal dimension of the silica-imprinted pore surface. Moreover, from the fact that the silica-imprinted pore surface with broad relative pore size distribution (PSD) gave lower value of the individual surface fractal dimension than that pore surface with narrow relative PSD, it is concluded that as the silica-imprinted pores comprising the carbon specimen agglomerate, the individual surface fractal dimension of that pore surface decreases.
机译:使用N {sub} 2气体吸附法和透射电子显微镜(TEM)图像分析方法研究了具有各种孔结构的介孔碳电极的分形特性。通过用不同的胶体二氧化硅颗粒压印用作碳质前体的中间相沥青来制备具有各种孔结构的介孔碳。所有压印的介孔碳均由中间相沥青碳化和二氧化硅压印产生的两组孔组成。通过对N {sub} 2气体吸附等温线的分析来确定碳样品的整体表面分形维数。为了将碳化诱导的孔表面的表面分形维数与二氧化硅压印的孔表面的分形维数区分开,从TEM图像的图像分析中确定了各个表面分形维数。通过将总表面分形维数与各个表面分形维数进行比较,可以看出,总表面分形维数受到二氧化硅压印的孔表面的各个表面分形维数的关键影响。此外,从具有相对的相对孔径分布(PSD)的二氧化硅印迹的孔表面给出的单个表面分形维数低于具有相对的相对PSD的狭窄孔表面的事实,得出以下结论:碳试样附聚时,孔表面的单个表面分形维数减小。

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