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Copper hydride formation in the electroless copper plating process: in situ X-ray diffraction evidence and electrochemical study

机译:化学镀铜过程中氢化铜的形成:原位X射线衍射证据和电化学研究

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摘要

Copper hydride, CuH, has been shown by in situ X-ray diffraction method to form in the process of electroless copper deposition in alkaline solutions containing Cu-II complexes with tartrate and ammonia and borohydride, BH4-, as a reducing agent. The rate of possible chemical and electrochemical steps was measured and compared with the rate of autocatalytic Cu-II reduction process. Results indicate the existence of two process routes: (1) coupling of simultaneous electrochemical reactions of BH4- oxidation and Cu-II reduction with the enhancement of cathodic reaction due to H-2 evolution in anodic reaction, (2) electrochemical steps of Cu-II reduction to Cu-I and consecutive chemical steps of CuH formation and decomposition. The route including CuH intermediate gives a lower Cu deposition rate. (C) 1998 Elsevier Science Ltd. All rights reserved. [References: 15]
机译:氢化铜(CuH)已通过原位X射线衍射法显示出,该化学铜是在含有酒石酸盐和氨水的Cu-II配合物和硼氢化物(BH4-)作为还原剂的碱性溶液中化学镀铜过程中形成的。测量了可能的化学和电化学步骤的速率,并将其与自催化Cu-II还原过程的速率进行了比较。结果表明存在两种工艺路线:(1)BH4-氧化和Cu-II还原同时进行的电化学反应与阳极反应中H-2演化引起的阴极反应的增强相耦合;(2)Cu-的电化学步骤II还原为Cu-I以及CuH形成和分解的连续化学步骤。包含CuH中间体的途径会降低Cu的沉积速率。 (C)1998 Elsevier ScienceLtd。保留所有权利。 [参考:15]

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