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Improving the Performance of Green LEDs by Low-Temperature Annealing of p-GaN with PdZn

机译:通过PdZn的p-GaN的低温退火改善绿色LED的性能

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摘要

This article reports the electrical properties of p-GaN annealed at low activation temperature by using a PdZn film in green InGaN/GaN multiquantum well (MQW) light-emitting diodes (LEDs). Electroluminescence (EL) intensity of green MQW LED annealed at 600°C using PdZn was improved by 33% at 20 mA compared to that annealed at 800°C without PdZn. These results are attributed to an increase of the hole concentration of p-GaN due to removal of hydrogen in p-GaN by PdZn and a decrease in thermal damage of MQW at low activation temperature.
机译:本文报道了通过在绿色InGaN / GaN多量子阱(MQW)发光二极管(LED)中使用PdZn膜在低激活温度下退火的p-GaN的电学性质。与未使用PdZn的800°C退火相比,使用PdZn的600°C退火的绿色MQW LED的电致发光(EL)强度提高了33%。这些结果归因于由于在PdZn中去除p-GaN中的氢而导致的p-GaN的空穴浓度的增加以及在低活化温度下MQW的热损伤的减少。

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