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首页> 外文期刊>Electroanalysis >Constant-distance mode scanning electrochemical microscopy. Part II: High-resolution SECM imaging employing Pt nanoelectrodes as miniaturized scanning probes
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Constant-distance mode scanning electrochemical microscopy. Part II: High-resolution SECM imaging employing Pt nanoelectrodes as miniaturized scanning probes

机译:等距模式扫描电化学显微镜。第二部分:采用Pt纳米电极作为小型扫描探针的高分辨率SECM成像

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The potential of needle-type Pt disk nanoelectrodes as extremely miniaturized scanning probes for high resolution scanning electrochemical microscopy (SECM) was investigated. The accuracy of a piezoelectric shear-force based distance control allowed a precise positioning of the Pt nanoelectrodes in close proximity to the surface of interest not only in tip approach experiments but also throughout scanning and SECM imaging. As proof of the advanced quality of SECM imaging, high-resolution current and topography images of a three-dimensional LIGA microstructure will be presented both simultaneously acquired by operating Pt nanoelectrodes in the constant-distance mode of SECM. [References: 36]
机译:研究了针型铂圆盘纳米电极作为用于高分辨率扫描电化学显微镜(SECM)的极小型扫描探针的潜力。基于压电剪切力的距离控制的准确性,不仅在尖端方法实验中而且在整个扫描和SECM成像中,都可以将Pt纳米电极精确定位在所关注的表面附近。为了证明SECM成像的高质量,将通过在SECM的等距模式下操作Pt纳米电极同时获取三维LIGA微观结构的高分辨率电流图像和形貌图像。 [参考:36]

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