Complex electronics products (EP) are defined in technical documentation as an entire series of parameters, the values of which determine the level of product quality. Parameters can be differentiated according to their importance regarding the implementation of purpose functions. International standard ISO-2859-0 recommends to divide parameters into two - A, B - or three - A, B, C -classes (groups). Here A - most important or significant parameters, and B, C - secondary or less significant parameters. Such classification of parameters is convenient when analyzing problems of multi-parametric product quality control. When imitational modeling is applied, stochastic models of quality level are required for separate parameters, their groups and for entire product [1-5]. In companies which utilize modern technologies databases of manufactured production and technological processes are constantly maintained and complemented. Data is often read and input automatically. By using computer networks and database control and analysis systems, information can be transmitted in real-time and can be used in decision making processes at each intermediate or final stage of manufacture. Thus there is a possibility to use information not only from the current but also from the previous stages of manufacture. That can increase the quality of EP [6-18].
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