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首页> 外文期刊>ECS Journal of Solid State Science and Technology >Thermal Shields for Heat Loss Reduction in Siemens-Type CVD Reactors
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Thermal Shields for Heat Loss Reduction in Siemens-Type CVD Reactors

机译:减少西门子型CVD反应器热损失的隔热屏

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摘要

The use of thermal shields to reduce radiation heat loss in Siemens-type CVD reactors is analyzed, both theoretically and experimentally. The potential savings from the use of the thermal shields is first explored using a radiation heat model that takes emissivity variations with wavelength into account, which is important for materials that do not behave as gray bodies. The theoretical calculations confirm that materials with lower surface emissivity lead to higher radiation savings. Assuming that radiation heat loss is responsible for around 50% of the total power consumption, a reduction of 32.9% and 15.5% is obtained if thermal shields with constant emissivities of 0.3 and 0.7 are considered, respectively. Experiments considering different thermal shields are conducted in a laboratory CVD reactor, confirming that the real materials do not behave as gray bodies, and proving that significant energy savings in the polysilicon deposition process are obtained. Using silicon as a thermal shield leads to energy savings of between 26.5-28.5%. For wavelength-dependent emissivities, the model shows that there are significant differences in radiation heat loss, of around 25%, when compared to that of constant emissivity. The results of the model highlight the importance of having reliable data on the emissivities within the relevant range of wavelengths, and at deposition temperatures, which remains a pending issue. (c) 2016 The Electrochemical Society. All rights reserved.
机译:从理论上和实验上分析了使用隔热屏减少西门子型CVD反应器中的辐射热损失。首先使用辐射热模型来探索使用隔热板的潜在节省,该模型考虑了发射率随波长的变化,这对于不表现为灰体的材料很重要。理论计算证实,具有较低表面发射率的材料可以节省更多的辐射。假设辐射热损耗约占总功耗的50%,如果分别考虑恒定辐射率分别为0.3和0.7的隔热屏,则可减少32.9%和15.5%。在实验室的CVD反应器中进行了考虑不同隔热板的实验,证实了真实的材料不会表现为灰体,并证明在多晶硅沉积过程中可节省大量能源。使用硅作为隔热罩可节省26.5-28.5%的能源。对于与波长相关的发射率,该模型显示,与恒定发射率相比,辐射热损失存在明显差异,约为25%。模型的结果突出了在相关波长范围内和沉积温度下具有可靠的发射率数据的重要性,这仍然是一个悬而未决的问题。 (c)2016年电化学学会。版权所有。

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