A De-Embedding Procedure to Determine the Equivalent Circuit Parameters of RF CNTFETs

摘要

In this paper we present a de-embedding procedure in order to determine the equivalent circuit parameters of CNTFETs for RF applications. This proposed technique allows to remove random errors in measured S parameters of small-signal device: in this way the intrinsic model of CNTFETs can be implement directly in simulation software. (C) 2016 The Electrochemical Society. All rights reserved.