Analysis of Three-State Device Parallel System Subject to Time Varying Open-Mode Failure and Repair Rates

摘要

In this paper we study the effect of critical human errors and common-cause failures on the performance of a system composed of three-state devices parallel components assuming that the open-mode failure rates of the operating units and the repair rates of the units failed due to open-mode failure are time varying. In this case, the system fails when a device fails in short-mode, or a common-cause failure or a critical human error occurs, or all devices fail in open-mode. The Markov method is used to develop generalized expressions for system state probabilities, system availability and reliability.