Microwave andMillimeter-Wave Sensors, Systems, and Techniques for Electromagnetic Imaging and Materials Characterization

摘要

Microwave and millimeter-wave sensors, systems, and techniques have been acquiring an ever-growing importance in the field of imaging and materials characterization. This interest is primarily motivated by the many advantages of microwaves and millimeter waves. First of all, these systems are capable of directly measuring quantities related to dielectric properties of inspected objects. Furthermore, nowadays microwave and millimeter-wave instrumentation is relatively low cost, especially with respect to other systems (e.g., X-rays). These systems are also relatively compact, allowing portability of the devices and consequently the possibility of performing in-situ measurements. Moreover, the systems are safe to the user as a result of the low transmission energy required for performing the inspection and the nonhazardous behavior of the radiation in the microwave and millimeter-wave frequency bands.