首页> 外文期刊>International Journal of Modern Physics, B. Condensed Matter Physics, Statistical Physics, Applied Physics >Improvement of measurement accuracy of strain of thin film by CCD camera with a template matching method using the 2nd-order polynomial interpolation
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Improvement of measurement accuracy of strain of thin film by CCD camera with a template matching method using the 2nd-order polynomial interpolation

机译:使用二阶多项式插值的模板匹配方法提高CCD相机测量薄膜应变的精度

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摘要

In this study, a system for non-contact in-situ measurement of strain during tensile test of thin films by using CCD camera with marking surface of specimen by black pen was implemented as a sensing device. To improve accuracy of measurement when CCD camera is used, this paper proposed a new method for measuring strain during tensile test of specimen with micrometer size. The size of pixel of CCD camera determines resolution of measurement, but the size of pixel can not satisfy the resolution required in tensile test of thin film because the extension of the specimen is very small during the tensile test. To increase resolution of measurement, the suggested method performs an accurate subpixel matching by applying 2nd order polynomial interpolation method to the conventional template matching. The algorithm was developed to calculate location of subpixel providing the best matching value by performing single dimensional polynomial interpolation from the results of pixel-based matching at a local region of image. The measurement resolution was less than 0.01 times of original pixel size. To verify the reliability of the system, the tensile test for the BeNi thin film was performed, which is widely used as a material in micro-probe tip. Tensile tests were performed and strains were measured using the proposed method and also the capacitance type displacement sensor for comparison. It is demonstrated that the new strain measurement system can effectively describe a behavior of materials after yield during the tensile test of the specimen at microscale with easy setup and better accuracy.
机译:在这项研究中,作为一个传感装置,采用了一个系统,该系统使用CCD相机,用黑笔在标本的标记表面上进行非拉伸原位测量薄膜拉伸试验时的应变。为了提高使用CCD相机时的测量精度,提出了一种新的测量千分尺试样拉伸试验中应变的方法。 CCD摄像机的像素尺寸决定了测量的分辨率,但是像素尺寸不能满足薄膜拉伸试验所需的分辨率,因为在拉伸试验中样品的伸长很小。为了提高测量分辨率,建议的方法通过将二阶多项式插值方法应用于常规模板匹配来执行精确的子像素匹配。通过从图像局部区域中基于像素的匹配结果执行一维多项式插值,开发出该算法以计算提供最佳匹配值的子像素的位置。测量分辨率小于原始像素大小的0.01倍。为了验证系统的可靠性,对BeNi薄膜进行了拉伸试验,该薄膜被广泛用作微探针头中的材料。使用所提出的方法进行了拉伸测试并测量了应变,并且还使用了电容式位移传感器进行比较。结果表明,新的应变测量系统可以有效地描述试样在微观尺度上的拉伸试验过程中屈服后材料的行为,并且安装简便,精度更高。

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